Advances in semiconductor technology and decreasing tolerances in microchip design require simultaneous improvements in both chemical purity and fabrication. Demand for lower detection limits requires new approaches to sample handling and trace elemental analysis – within the fab and throughout the supply chain. ESI has been at the forefront of improving analytical performance for semiconductor materials since the company was first founded. The prepFAST S line of sample handling systems has revolutionized automated trace elemental analysis of ultra-pure chemicals, allowing ever-lower detection limits to be achieved, and increasing operator safety through reduced handling of hazardous materials.